Archives
Vol. 8 No. 16 August 25, 2011
Electron devices, circuits, and systems
Electron devices, circuits, and systems
1267-1274 : LETTER
Study on detection and recognition of phase contamination and multimode propagation in ionosphere for OTHR
Wireless communication hardware
1275-1280 : LETTER
Channel selection for IEEE 802.11 based wireless LANs using 2.4GHz band
Wireless circuits and devices
1281-1286 : LETTER
Optimal spectrum sensing in cooperative cognitive two-way relay networks
Integrated circuits
1287-1293 : LETTER
A CMOS harmonic rejection mixer based on current mirror amplifiers
Microwave and millimeter wave devices, circuits, and systems
1294-1301 : LETTER
Improvement of SIW filter upper stopband performance using bypass coupling substrate integrated circular cavity (SICC)
Storage technology
1302-1308 : LETTER
A media cache structure for multimedia applications in embedded systems
Electron devices, circuits, and systems
1309-1314 : LETTER
Distribution of post-breakdown resistance of MOSTFETs
Microwave and millimeter wave devices, circuits, and systems
1315-1321 : LETTER
Switchable double band-notch ultra wideband monopole antenna
Integrated circuits
1322-1329 : LETTER
Carry select adder with sub-block power gating for reducing active-mode leakage in sub-32-nm VLSIs
Electromagnetic theory
1330-1336 : LETTER
Fast computation for electromagnetic scattering problems using a heterogeneous multi-core processor
Fiber-optic communication
1337-1342 : LETTER
A hybrid pump wavelength assignment scheme for optical packet switch with parametric wavelength converters
Integrated circuits
1343-1347 : LETTER
Efficiency optimization of charge pump circuit in NAND FLASH memory
Microwave and millimeter wave devices, circuits, and systems
1348-1353 : LETTER
Design of wide stopband lowpass filter with sharp roll-off
Integrated circuits
1354-1360 : LETTER
Phase-shift self-oscillating class-D audio amplifier with multiple-pole feedback filter
Electromagnetic theory
1361-1366 : LETTER
Finite-element time-domain beam propagation method with perfectly matched layer for electron waveguide simulations
Integrated circuits
1367-1373 : LETTER
A scan disabling-based BAST scheme for test cost reduction