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ONLINE ISSN:1349-2543

J-tagemark

Archives

Vol. 4 No. 6 March 25, 2007

Electron devices

185-191 : LETTER

Carrier separation and Vth measurements of W-La2O3 gated MOSFET structures after electrical stress

Joel Molina, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai

 

Integrated circuits