ELEX Best Paper Award in the year 2023
Integrated circuits
20220558 : LETTER
A 41-GHz 19.4-dBm Psat CMOS Doherty power amplifier for 5G NR applications
Zheng Li, Zixin Chen, Qiaoyu Wang, Junqing Liu, Jian Pang, Atsushi Shirane, Kenichi Okada
THz devices, circuits and modules
20230395 : LETTER
Low-noise balanced mixer for 300-GHz band based on Fermi-level managed barrier diode on SiC platform
Hiroshi Ito, Yuma Kawamoto, Takahiro Ohara, Tadao Nagatsuma, Tadao Ishibashi
Archives
Vol. 19 No. 24
Power devices and circuits
20220340 : LETTER
Model predictive current control for dual three-phase PMSM with hybrid voltage vector
Fenghuang Cai, Fuyang Yang, Qinqin Chai, Jiahui Jiang
Electromagnetic theory
20220342 : LETTER
Analysis of underwater motion noise characteristics of electrode pair towed antenna
Xu Xie, Yuhang Wang, Qin Wu, Zhi Huang
RF/Microwave device, circuits, and hardware
20220425 : LETTER
A transformer matching X-band MMIC power amplifier with temperature compensation technique on 0.25µm GaN process
Yihui Fan, Jing Wan, Zhe Yang, Gong Gao, Wenxiang Zhen, Yuepeng Yan, Xiaoxin Liang
Integrated circuits
20220430 : LETTER
Unit cell mismatch scrambling method for high-resolution unary DAC based on virtual 3D layout
Dan Yao, Xuanyan Bai, Shogo Katayama, Anna Kuwana, Kazuyuki Kawauchi, Haruo Kobayashi, Kouji Hirai, Akira Suzuki, Satoshi Yamada, Tomoyuki Kato, Ritsuko Kitakoga, Takeshi Shimamura, Gopal Adhikari, Nobuto Ono, Kazuhiro Miura, Shigeya Yamaguchi
Integrated circuits
20220432 : LETTER
A 21.3-24.5Gb/s low jitter PLL-based clock and data recovery circuit with cascode-coupled quadrature LC-VCO
Chengxian Pan, Chunqi Shi, Guoliang Zhao, Boxiao Liu, Leilei Huang, Runxi Zhang
Electron devices, circuits and modules
20220440 : LETTER
Adaptive image recognition circuit based on CMOS-based memristor
Sheng Xie, Jinhao Gong, Xurui Mao
Electron devices, circuits and modules
20220460 : LETTER
28.4cc ultra-density 65W type-C adaptor with current mirror integration method
Xiaofeng Lyu, Chenge Wang, Hua Chen, Faxin Yu
Integrated circuits
20220465 : LETTER
Investigation of endurance degradation for 3-D charge trap NAND flash memory with bandgap-engineered tunneling oxide
Jongwoo Kim, Hyungjun Jo, Yonggyu Cho, Hyunyoung Shim, Jaesung Sim, Hyungcheol Shin
Optical hardware
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