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ONLINE ISSN:1349-2543

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Archives

Vol. 3 No. 16 August 25, 2006

Electron devices

379-384 : LETTER

Characterization of punch-through phenomenon in SiC-SBD by capacitance-voltage measurement at high reverse bias voltage

Tsuyoshi Funaki, Shuntaro Matsuzaki, Tsunenobu Kimoto, Takashi Hikihara

 

Microwave and millimeter wave devices, circuits, and systems