Summary

International Symposium on Electromagnetic Compatibility

2004

Session Number:2A3

Session:

Number:2A3-1

Prediction of EMI-induced distortion phenomena in CMOS opamps by a new large-signal model

F. Fiori,  

pp.253-256

Publication Date:2004/6/1

Online ISSN:2188-5079

DOI:10.34385/proc.11.2A3-1

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