Summary
International Symposium on Electromagnetic Compatibility
2009
Session Number:24S1
Session:
Number:24S1-4
Study on ESD/EMI Phenomena for Magnetic Reproducing Head
T. Ohtsu,
pp.777-780
Publication Date:2009/7/20
Online ISSN:2188-5079
Summary:
GMR heads, the most electrostatic discharge (ESD/EOS) sensitive device of all electron devices, are used for high density magnetic recording applications. A number of problems related to electrostatic discharge phenomenon in GMR heads have been reported, including melting and diffusion caused by the Joule heating by ESD currents, pinning rotation and demagnetization resulting from high magnetic field strength, and dielectric breakdown induced by a high voltage. In recent years, there has been a growing concern about damaging GMR heads from Electro-Magnetic Interference (EMI). In this paper, we studied a relatively easy method for comprehending the basic characteristics of EMI using the instruments that are widely used in conventional ESD evaluation.