Summary

International Symposium on Electromagnetic Compatibility

2009

Session Number:22R1

Session:

Number:22R1-2

Differences in the Coupling Behavior of Fast Transient Pulses to Short PCB Traces

N. Maeda,  

pp.449-451

Publication Date:2009/7/20

Online ISSN:2188-5079

DOI:10.34385/proc.14.22R1-2

PDF download (240.3KB)

Summary:
Developing automotive electronic control units (ECUs) or sensors requires thorough immunity tests to prevent them from malfunctions caused by onboard or external electro-magnetic noise. To reduce the development costs and time from repeating those tests, EM noise tolerance design at the design stage is important. If the estimation of intruding noise from wire harness into ECU or sensor becomes possible, the countermeasures can be designed using circuit board simulation before conducting actual tests. This report shows the method to estimate the noise voltage intruding into ECUs or sensors using least squares estimation for the S parameter models of the test equipment with directly immeasurable port. The test result applying this method to BCI test shows the intruding noise voltage can be estimated with 2.2dB accuracy below 400MHz.