Summary
International Symposium on Electromagnetic Compatibility
2009
Session Number:21R1
Session:
Number:21R1-2
Optically Scanning Probe System for Electromagnetic Near Field Measurements
M. Takahashi,
pp.45-48
Publication Date:2009/7/20
Online ISSN:2188-5079
Summary:
An optically scanning electromagnetic field probe system, consisting of an electro-optic or magneto-optic crystal substrate and a galvano scanner, has been developed for the high speed, low-invasive measurement of electromagnetic near field distribution. We present some examples of electric field distribution measurements using a LiNbO3 crystal substrate and the probe system. We have also measured magnetic field distributions above an MSL using a magnetic garnet thin film in the gigahertz range.