Information and Systems-Dependable Computing(Date:2012/02/06)

Presentation
表紙

,  

[Date]2012/2/6
[Paper #]
目次

,  

[Date]2012/2/6
[Paper #]
Design of Dual Edge Triggered Flip-Flops and Application to Signal Delay Detection

Yoshihiro OHKAWA,  Yukiya MIURA,  

[Date]2012/2/6
[Paper #]DC2011-76
An Evaluation of the Effects for Hardware Trojan Designs in AES Encryption Circuits

Amy OGITA,  Toshinori HOSOKAWA,  Masayoshi YOSHIMURA,  

[Date]2012/2/6
[Paper #]DC2011-77
Pattern Merging for Additional Path Delay Fault Detection with Transition Delay Fault Test

Hiroaki Tanaka,  Kohei Miyase,  Kazunari Enokimoto,  Xiaoqing Wen,  Seiji Kajihara,  

[Date]2012/2/6
[Paper #]DC2011-78
Note on Layout-Aware High Accuracy Estimation of Fault Coverage

Masayuki Arai,  Yoshihiro Shimizu,  Kazuhiko Iwasaki,  

[Date]2012/2/6
[Paper #]DC2011-79
A method to reduce shift-toggle rate for low power BIST

Takaaki KATO,  Senling WANG,  Kohei MIYASE,  Yasuo SATO,  Seiji KAJIHARA,  

[Date]2012/2/6
[Paper #]DC2011-80
A new problem at Boundary-Scan testing : an internal disruption within IC during interconnect testing

Shuichi KAMEYAMA,  Masayuki Baba,  Yoshinobu HIGAMI,  Hiroshi TAKAHASHI,  

[Date]2012/2/6
[Paper #]DC2011-81
A method to reduce the number of testpatterns for transition faults using control point insertions

Akihiko TAKAHASHI,  Toshinori HOSOKAWA,  Masayoshi YOSHIMURA,  

[Date]2012/2/6
[Paper #]DC2011-82
A Test Generation Method for Synchronously Designed QDI Circuits

Koki UCHIDA,  Eri MURATA,  Satoshi OHTAKE,  Yasuhiko NAKASHIMA,  

[Date]2012/2/6
[Paper #]DC2011-83
An approach for adaptive determination of IDDQ testing criteria based on process parameter estimation

Michihiro SHINTANI,  Takashi SATO,  

[Date]2012/2/6
[Paper #]DC2011-84
Dynamic Test Scheduling for In-Field Aging Detection

Yosuke MORINAGA,  Tomokazu YONEDA,  Hyunbean YI,  Michiko INOUE,  

[Date]2012/2/6
[Paper #]DC2011-85
Evaluation of a thermal and voltage estimation circuit for field test

Yousuke MIYAKE,  Yasuo SATO,  Seiji KAJIHARA,  Kohei MIYASE,  Yukiya MIURA,  

[Date]2012/2/6
[Paper #]DC2011-86
複写される方へ

,  

[Date]2012/2/6
[Paper #]
Notice for Photocopying

,  

[Date]2012/2/6
[Paper #]
奥付

,  

[Date]2012/2/6
[Paper #]
裏表紙

,  

[Date]2012/2/6
[Paper #]