| Presentation | 2012-02-13 A method to reduce the number of testpatterns for transition faults using control point insertions Akihiko TAKAHASHI, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In recent year, the growing density and complexity for VLSIs cause an increase in the number of test patterns. Moreover, defects with timing delay which cannot be detected by test patterns for stuck-at fault increase. Therefore, it is important to detect not only stuck-at faults but also transition faults. In this paper, we propose a control point insertion method to reduce the number of test patterns for transition faults in broad-side testing. Control points are inserted into D-input signal lines of scan flip-flops and the values of signal lines in both time frame 1 and time frame 2 are identified as don't care bits. As the result of control point insertion, the number of don't care bits increases and test compaction efficiency becomes high. Experimental results for ISCAS'89 benchmark circuits show that our proposed control point insertion method reduced the number of test patterns for transition faults by 0～38.0% compared with the conventional test compaction oriented control point insertion method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | transition faults / broadside / testing control point insertions / don't care identification / test compaction |
| Paper # | DC2011-82 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2012/2/6(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A method to reduce the number of testpatterns for transition faults using control point insertions |
| Sub Title (in English) | |
| Keyword(1) | transition faults |
| Keyword(2) | broadside |
| Keyword(3) | testing control point insertions |
| Keyword(4) | don't care identification |
| Keyword(5) | test compaction |
| 1st Author's Name | Akihiko TAKAHASHI |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industrial Technology, Nihon University |
| 3rd Author's Name | Masayoshi YOSHIMURA |
| 3rd Author's Affiliation | Graduate School of Infomation Science and Electrical Engineering, Kyushu University |
| Date | 2012-02-13 |
| Paper # | DC2011-82 |
| Volume (vol) | vol.111 |
| Number (no) | 435 |
| Page | pp.pp.- |
| #Pages | 6 |
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