| Presentation | 2012-02-13 Evaluation of a thermal and voltage estimation circuit for field test Yousuke MIYAKE, Yasuo SATO, Seiji KAJIHARA, Kohei MIYASE, Yukiya MIURA, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | High dependability is required for an embedded system VLSI. High functionality and high performance of VLSI, due to the miniaturization of the manufacturing process, increase a performance deterioration caused by various aging mechanisms of VLSI circuits. Therefore, it is important to avoid a system down due to a sudden failure of VLSI due to an aging. The increase of a circuit delay is known as a typical aging phenomenon of a VLSI. However, the delay measurement for detecting aging on field needs to take account of the influence of thermal and voltage fluctuations. In this paper, for achieving highly accurate delay measurements that eliminate the effects of environmental factors, we show the test-chip design and evaluations of the thermal and voltage monitors, which consist of dedicated Ring-Oscillators, and discuss the estimation accuracy of temperature and voltage. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Aging / Field test / Temperature and Voltage monitor / Ring Oscillator |
| Paper # | DC2011-86 |
| Date of Issue |
| Conference Information | |
| Committee | DC |
|---|---|
| Conference Date | 2012/2/6(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Dependable Computing (DC) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of a thermal and voltage estimation circuit for field test |
| Sub Title (in English) | |
| Keyword(1) | Aging |
| Keyword(2) | Field test |
| Keyword(3) | Temperature and Voltage monitor |
| Keyword(4) | Ring Oscillator |
| 1st Author's Name | Yousuke MIYAKE |
| 1st Author's Affiliation | Kyushu Institute of Technology:JST, CREST() |
| 2nd Author's Name | Yasuo SATO |
| 2nd Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| 3rd Author's Name | Seiji KAJIHARA |
| 3rd Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| 4th Author's Name | Kohei MIYASE |
| 4th Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| 5th Author's Name | Yukiya MIURA |
| 5th Author's Affiliation | Tokyo Metropolitan University:JST, CREST |
| Date | 2012-02-13 |
| Paper # | DC2011-86 |
| Volume (vol) | vol.111 |
| Number (no) | 435 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |