| Presentation | 2012-02-13 Dynamic Test Scheduling for In-Field Aging Detection Yosuke MORINAGA, Tomokazu YONEDA, Hyunbean YI, Michiko INOUE, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A test mechanism called DART was proposed to detect circuits' delay degradation caused by transistor aging. DART utilizes system idle times and performs periodical in-field self-test and diagnosis. The circuit aging is predicted from the measured delay, and it issues a warning before the circuit delay exceeds a given limit. In field test, however, there are tight constraints on test time and test data volume compared with those in manufacturing test, it is difficult to test the whole circuit within a single field test. This paper presents a test scheduling method to achieve low warning failure rate. Experimental results using Monte Carlo simulation show the effectiveness of the proposed method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | in-field reliability / test scheduling / transistor aging |
| Paper # | DC2011-85 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2012/2/6(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Dynamic Test Scheduling for In-Field Aging Detection |
| Sub Title (in English) | |
| Keyword(1) | in-field reliability |
| Keyword(2) | test scheduling |
| Keyword(3) | transistor aging |
| 1st Author's Name | Yosuke MORINAGA |
| 1st Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology() |
| 2nd Author's Name | Tomokazu YONEDA |
| 2nd Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST |
| 3rd Author's Name | Hyunbean YI |
| 3rd Author's Affiliation | Dept. of Computer Engineering, Hanbat National University |
| 4th Author's Name | Michiko INOUE |
| 4th Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST |
| Date | 2012-02-13 |
| Paper # | DC2011-85 |
| Volume (vol) | vol.111 |
| Number (no) | 435 |
| Page | pp.pp.- |
| #Pages | 6 |
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