| Presentation | 2012-02-13 A new problem at Boundary-Scan testing : an internal disruption within IC during interconnect testing Shuichi KAMEYAMA, Masayuki Baba, Yoshinobu HIGAMI, Hiroshi TAKAHASHI, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The miniaturization of electronic products is causing printed circuit boards to progress in the direction of higher density, using, for example, BGA (Ball Grid Array) devices. In this situation, Boundary-scan Test technology is increasingly more important, since it is the best way to detect manufacturing defects easily on the dense boards. This paper describes a side-effect caused by an internal disruption within an IC during the Boundary-Scan test, and also describes the root-cause and the measures for it on the basis of our experience. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Boundary-scan / test / internal circuit / interconnect testing / Lobotomy problem |
| Paper # | DC2011-81 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2012/2/6(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A new problem at Boundary-Scan testing : an internal disruption within IC during interconnect testing |
| Sub Title (in English) | |
| Keyword(1) | Boundary-scan |
| Keyword(2) | test |
| Keyword(3) | internal circuit |
| Keyword(4) | interconnect testing |
| Keyword(5) | Lobotomy problem |
| 1st Author's Name | Shuichi KAMEYAMA |
| 1st Author's Affiliation | Fujitsu Limited:Ehime University() |
| 2nd Author's Name | Masayuki Baba |
| 2nd Author's Affiliation | Fujitsu Limited |
| 3rd Author's Name | Yoshinobu HIGAMI |
| 3rd Author's Affiliation | Ehime University |
| 4th Author's Name | Hiroshi TAKAHASHI |
| 4th Author's Affiliation | Ehime University |
| Date | 2012-02-13 |
| Paper # | DC2011-81 |
| Volume (vol) | vol.111 |
| Number (no) | 435 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |