Presentation 2012-02-13
An Evaluation of the Effects for Hardware Trojan Designs in AES Encryption Circuits
Amy OGITA, Toshinori HOSOKAWA, Masayoshi YOSHIMURA,
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Abstract(in English) Companies which specialize in LSI designs and the marketing of products without manufacturing LSIs are called to "fabless". The business model that fabless companies design LSIs and foundry companies manufacture LSIs recently increases. Especially, the number of cases that LSI manufacturing is outsourced to foreign foundry companies increases. The outsourcing of LSI manufacturing to foreign foundry companies facilitates inserting Hardware Trojan circuits into LSIs. Hardware Trojan circuits are additional ones inserted into LSIs by attackers. The behavior of Hardware Trojan circuits expose products to the threat such as leakages of secret information, information falsification, and circuit destruction. In this paper, such a situation is assumed that LSI design partners insert Hardware Trojan circuits into design descriptions. LSI design partners are defined as other companies where fabless companies outsource parts of LSI designs. AES encryption circuits are targeted as the insertion of Hardware Trojan circuits. In this paper, we propose Hardware Trojan designs to leak a data relevant to an encryption key from AES encryption circuits and evaluate additional area overhead and toggle coverage compared with original circuits.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) AES encryption circuits / hardware Trojan / security / design for testability
Paper # DC2011-77
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Committee DC
Conference Date 2012/2/6(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An Evaluation of the Effects for Hardware Trojan Designs in AES Encryption Circuits
Sub Title (in English)
Keyword(1) AES encryption circuits
Keyword(2) hardware Trojan
Keyword(3) security
Keyword(4) design for testability
1st Author's Name Amy OGITA
1st Author's Affiliation Graduate School of Industrial Technology, Nihon University()
2nd Author's Name Toshinori HOSOKAWA
2nd Author's Affiliation College of Industrial Technology, Nihon University
3rd Author's Name Masayoshi YOSHIMURA
3rd Author's Affiliation Graduate School of Information Science and Electrical Engineering, Kyushu University
Date 2012-02-13
Paper # DC2011-77
Volume (vol) vol.111
Number (no) 435
Page pp.pp.-
#Pages 6
Date of Issue