Presentation | 2012-02-13 Note on Layout-Aware High Accuracy Estimation of Fault Coverage Masayuki Arai, Yoshihiro Shimizu, Kazuhiko Iwasaki, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Shrinking feature size and higher integration on semiconductor device manufacturing technology bring a problem of the gap between the defect level estimated at the design stage from the reported one for fabricated devices. In this study, as one possible strategy to accurately estimate the defect level, we discuss on a fault coverage estimation with more accuracy for the given test pattern set. For each possible wire and wire pair in a given layout data, we execute critical area analysis multiple times, assuming different defect sizes. On the basis of critical areas obtained, we calculate weighted open/bridge fault coverages, considering frequency of occurrence of each fault. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | weighted bridge fault coverage / weighted open fault coverage / layout-aware / critical area |
Paper # | DC2011-79 |
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Committee | DC |
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Conference Date | 2012/2/6(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Note on Layout-Aware High Accuracy Estimation of Fault Coverage |
Sub Title (in English) | |
Keyword(1) | weighted bridge fault coverage |
Keyword(2) | weighted open fault coverage |
Keyword(3) | layout-aware |
Keyword(4) | critical area |
1st Author's Name | Masayuki Arai |
1st Author's Affiliation | Faculty of System Design, Tokyo Metropolitan University:Graduate School of System Design, Tokyo Metropolitan University() |
2nd Author's Name | Yoshihiro Shimizu |
2nd Author's Affiliation | / Faculty of System Design, Tokyo Metropolitan University:Graduate School of System Design, Tokyo Metropolitan University |
3rd Author's Name | Kazuhiko Iwasaki |
3rd Author's Affiliation | |
Date | 2012-02-13 |
Paper # | DC2011-79 |
Volume (vol) | vol.111 |
Number (no) | 435 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |