Presentation | 2012-02-13 A method to reduce shift-toggle rate for low power BIST Takaaki KATO, Senling WANG, Kohei MIYASE, Yasuo SATO, Seiji KAJIHARA, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Logic BIST using scan design has a problem with high power dissipation during test. In this work we propose a method that reduces shift-toggle rate of scan flip-flops for low power testing of the scan-BIST. The proposed method adds an extra circuit for reduction of the signal transition probability of pseudo random test patterns generated by an LFSR. In the experiment, we show shift-toggle rate and fault coverage of the test patterns generated by the proposed method. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | BIST / scan test / low power dissipation / scan shift power |
Paper # | DC2011-80 |
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Committee | DC |
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Conference Date | 2012/2/6(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A method to reduce shift-toggle rate for low power BIST |
Sub Title (in English) | |
Keyword(1) | BIST |
Keyword(2) | scan test |
Keyword(3) | low power dissipation |
Keyword(4) | scan shift power |
1st Author's Name | Takaaki KATO |
1st Author's Affiliation | Department of Computer Science and Electronics Kyushu Institute of Technology:JST CREST() |
2nd Author's Name | Senling WANG |
2nd Author's Affiliation | Department of Computer Science and Electronics Kyushu Institute of Technology:JST CREST |
3rd Author's Name | Kohei MIYASE |
3rd Author's Affiliation | Department of Computer Science and Electronics Kyushu Institute of Technology:JST CREST |
4th Author's Name | Yasuo SATO |
4th Author's Affiliation | Department of Computer Science and Electronics Kyushu Institute of Technology:JST CREST |
5th Author's Name | Seiji KAJIHARA |
5th Author's Affiliation | Department of Computer Science and Electronics Kyushu Institute of Technology:JST CREST |
Date | 2012-02-13 |
Paper # | DC2011-80 |
Volume (vol) | vol.111 |
Number (no) | 435 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |