Information and Systems-Dependable Computing(Date:2013/02/06)

Presentation
表紙

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[Date]2013/2/6
[Paper #]
目次

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[Date]2013/2/6
[Paper #]
A Hardware Implementation of a SAT Solver for Test Generation with Solution Reuse

Toshiya MUKAI,  Kenji UEDA,  Tsuyoshi IWAGAKI,  Hideyuki ICHIHARA,  Tomoo INOUE,  

[Date]2013/2/6
[Paper #]DC2012-80
Accelerating techniques for SAT-based test pattern generation

Yusuke MATSUNAGA,  

[Date]2013/2/6
[Paper #]DC2012-81
Note on Fault Coverage Estimation Using Critical Area Analysis

Yoshihiro shimizu,  Yuta Nakayama,  Masayuki Arai,  Kazuhiko Iwasaki,  

[Date]2013/2/6
[Paper #]DC2012-82
A don'tcare filling method to improve defbct detection capabilityu sing stuck-at fault test sets and transition fault test sets

Ryosuke WAKASUGI,  Toshinori HOSOKAWA,  Masayoshi YOSHIMURA,  

[Date]2013/2/6
[Paper #]DC2012-83
Characteristic Analysis of Signal Delay for Resistive Open Fault Detection

Hiroto OHGURI,  Hiroyuki YOTSUYANAGI,  Masaki HASHIZUME,  Toshiyuki TSUTSUMI,  Kouji YAMAZAKI,  Yoshinobu HIGAMI,  Hiroshi TAKAHASHI,  

[Date]2013/2/6
[Paper #]DC2012-84
On Fault detection method considering adjacent TSVs for a delay fault in TSV

Masanori NAKAMURA,  Hiroyuki YOTSUYANAGI,  Masaki HASHIZUME,  

[Date]2013/2/6
[Paper #]DC2012-85
An evaluation of Trojan Circuits on AES Encryption Circuits

Amy OGITA,  Toshinon HOSOKAWA,  Masayoshi YOSHIMURA,  

[Date]2013/2/6
[Paper #]DC2012-86
An Evaluatoin Method of Test Compactors for Secure

Masayoshi YOSHIMURA,  Yusuke MATSUNAGA,  

[Date]2013/2/6
[Paper #]DC2012-87
A Method of Acceptable Fault Identification Necessary Assignment in Logic Simplification for Error Tolerant Application

Shingo MATSUKI,  Junpei KAMEI,  Tsuyoshi IWAGAKI,  Hldeyuki ICHIHARA,  Tomoo INOUE,  

[Date]2013/2/6
[Paper #]DC2012-88
Temperature and voltage estimation considering manufacturing variability for a monitoring circuit

Yousuke MIYAKE,  Wataru TSUMORI,  Yasuo SATO,  Seui KAJIHARA,  Yukiya MIURA,  

[Date]2013/2/6
[Paper #]DC2012-89
Data Vblume Reduction Method for Unknown Value Handling in Built-in Self Test Used in Field

Yuta YOSHIMI,  Kazumi Hatayama,  Yuta Yamato,  Tomokazu Yoneda,  Michiko INOUE,  

[Date]2013/2/6
[Paper #]DC2012-90
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[Date]2013/2/6
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[Date]2013/2/6
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[Date]2013/2/6
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