Presentation | 2013-02-13 An Evaluatoin Method of Test Compactors for Secure Masayoshi YOSHIMURA, Yusuke MATSUNAGA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | There is a potential that the secret information on an encryption LSI is leaked from a scan chain There are many countermeasures against scan based attack In this paper, we discuss quality of these countermeasures under conditions attackers know the applied countermeasure A mutual information between the obtained information which an attacker can obtain and the secret information is used as a measure of security Area, fault coverage and diagnosability are used as mesures of countermeasures, qualitativel. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | scan based attack / security / mutual information / pattern generator / compactor |
Paper # | DC2012-87 |
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Committee | DC |
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Conference Date | 2013/2/6(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | An Evaluatoin Method of Test Compactors for Secure |
Sub Title (in English) | |
Keyword(1) | scan based attack |
Keyword(2) | security |
Keyword(3) | mutual information |
Keyword(4) | pattern generator |
Keyword(5) | compactor |
1st Author's Name | Masayoshi YOSHIMURA |
1st Author's Affiliation | Graduate School of Information Science and Electrical Engineering, Kyushu University() |
2nd Author's Name | Yusuke MATSUNAGA |
2nd Author's Affiliation | Graduate School of Information Science and Electrical Engineering, Kyushu University |
Date | 2013-02-13 |
Paper # | DC2012-87 |
Volume (vol) | vol.112 |
Number (no) | 429 |
Page | pp.pp.- |
#Pages | 5 |
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