Presentation 2013-02-13
An Evaluatoin Method of Test Compactors for Secure
Masayoshi YOSHIMURA, Yusuke MATSUNAGA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) There is a potential that the secret information on an encryption LSI is leaked from a scan chain There are many countermeasures against scan based attack In this paper, we discuss quality of these countermeasures under conditions attackers know the applied countermeasure A mutual information between the obtained information which an attacker can obtain and the secret information is used as a measure of security Area, fault coverage and diagnosability are used as mesures of countermeasures, qualitativel.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) scan based attack / security / mutual information / pattern generator / compactor
Paper # DC2012-87
Date of Issue

Conference Information
Committee DC
Conference Date 2013/2/6(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An Evaluatoin Method of Test Compactors for Secure
Sub Title (in English)
Keyword(1) scan based attack
Keyword(2) security
Keyword(3) mutual information
Keyword(4) pattern generator
Keyword(5) compactor
1st Author's Name Masayoshi YOSHIMURA
1st Author's Affiliation Graduate School of Information Science and Electrical Engineering, Kyushu University()
2nd Author's Name Yusuke MATSUNAGA
2nd Author's Affiliation Graduate School of Information Science and Electrical Engineering, Kyushu University
Date 2013-02-13
Paper # DC2012-87
Volume (vol) vol.112
Number (no) 429
Page pp.pp.-
#Pages 5
Date of Issue