| Presentation | 2013-02-13 Data Vblume Reduction Method for Unknown Value Handling in Built-in Self Test Used in Field Yuta YOSHIMI, Kazumi Hatayama, Yuta Yamato, Tomokazu Yoneda, Michiko INOUE, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Many approaches on test pattern compression targeted unknown value handlmg It is because unknown values have impacts on compression efficiency and test quality A similar problem happens when built-in self test(BIST) is used in field where we should also consider test constramts, such as test data volume, test application time and so on This paper focuses on the reduction of test data volume We utilize an unknown values handling approach called X-canceling, and propose a method which uses a common X-canceling timing to reduce data volume for X-canceling operation. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Built-in Self Test / BIST / Unknown Value Handling / Field Reliability |
| Paper # | DC2012-90 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2013/2/6(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Data Vblume Reduction Method for Unknown Value Handling in Built-in Self Test Used in Field |
| Sub Title (in English) | |
| Keyword(1) | Built-in Self Test |
| Keyword(2) | BIST |
| Keyword(3) | Unknown Value Handling |
| Keyword(4) | Field Reliability |
| 1st Author's Name | Yuta YOSHIMI |
| 1st Author's Affiliation | Nara Institute of Science and Technology() |
| 2nd Author's Name | Kazumi Hatayama |
| 2nd Author's Affiliation | Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST |
| 3rd Author's Name | Yuta Yamato |
| 3rd Author's Affiliation | Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST |
| 4th Author's Name | Tomokazu Yoneda |
| 4th Author's Affiliation | Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST |
| 5th Author's Name | Michiko INOUE |
| 5th Author's Affiliation | Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST |
| Date | 2013-02-13 |
| Paper # | DC2012-90 |
| Volume (vol) | vol.112 |
| Number (no) | 429 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |