| Presentation | 2013-02-13 A don'tcare filling method to improve defbct detection capabilityu sing stuck-at fault test sets and transition fault test sets Ryosuke WAKASUGI, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A single stuck-at fault model and a transition fault model have been widely used to generate test patterns for VLSIs However, defects which are not detected by test sets for the classical fault models recently increase with the growing density and complexity of VLSIs In this paper, fault sensitization coverage is defined as the simple measure of test quality for small delay faults, open faults, and bridging faults Defects which frequently occur in VLSIs are modeled as a small delay fault and an open fault whose detection conditions are complex This paper proposes a don't care filling method to improve fault sensitization coverage for given initial stuck-at fault test sets and transition fault test sets This method is possible to generate high quality test sets for small delay faults, open faults, and bndgmg faults without any impact on test data volume Experimental results show that final test sets generated by the proposed don't care filling method improved SDQL by 17-21%, open fault coverage by up to 7.1-11.1 % and birding fault coverage by up to 9.4% compared with given initial test sets. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | transition faults / open faults / fault sensitization coverage / small delay faults / SDQL / don't care filling |
| Paper # | DC2012-83 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2013/2/6(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A don'tcare filling method to improve defbct detection capabilityu sing stuck-at fault test sets and transition fault test sets |
| Sub Title (in English) | |
| Keyword(1) | transition faults |
| Keyword(2) | open faults |
| Keyword(3) | fault sensitization coverage |
| Keyword(4) | small delay faults |
| Keyword(5) | SDQL |
| Keyword(6) | don't care filling |
| 1st Author's Name | Ryosuke WAKASUGI |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industnal Technology, Nihon University |
| 3rd Author's Name | Masayoshi YOSHIMURA |
| 3rd Author's Affiliation | Graduate School of Information Science and Electrical Engineering, Kyushu University |
| Date | 2013-02-13 |
| Paper # | DC2012-83 |
| Volume (vol) | vol.112 |
| Number (no) | 429 |
| Page | pp.pp.- |
| #Pages | 6 |
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