Presentation 2013-02-13
Temperature and voltage estimation considering manufacturing variability for a monitoring circuit
Yousuke MIYAKE, Wataru TSUMORI, Yasuo SATO, Seui KAJIHARA, Yukiya MIURA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Delay increase due to aging phenomena is a critical issue of VLSIs For detecting such increase in field, a highly accurate delay measurement technology that considers the influence by temperature and voltage is strongly needed A method has been proposed that estimates chip temperature and voltage using a ring-oscillator-based monitonng circuit However, frequencies of the ring-oscillators are greatly influenced by process vanation Thus, we need to take into account the process variation for the accurate estimation of temperature and voltage. This paper discusses estimation of temperature and voltage considenng process variation for the momtonng circuit.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Delay measurement / Aging / Field test / Temperature and Voltage monitor / Ring Oscillator
Paper # DC2012-89
Date of Issue

Conference Information
Committee DC
Conference Date 2013/2/6(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Temperature and voltage estimation considering manufacturing variability for a monitoring circuit
Sub Title (in English)
Keyword(1) Delay measurement
Keyword(2) Aging
Keyword(3) Field test
Keyword(4) Temperature and Voltage monitor
Keyword(5) Ring Oscillator
1st Author's Name Yousuke MIYAKE
1st Author's Affiliation Kyushu Institute of Technology:JST, CREST()
2nd Author's Name Wataru TSUMORI
2nd Author's Affiliation Kyushu Institute of Technology:JST, CREST
3rd Author's Name Yasuo SATO
3rd Author's Affiliation Kyushu Institute of Technology:JST, CREST
4th Author's Name Seui KAJIHARA
4th Author's Affiliation Kyushu Institute of Technology:JST, CREST
5th Author's Name Yukiya MIURA
5th Author's Affiliation Tokyo Metropolitan University:JST, CREST
Date 2013-02-13
Paper # DC2012-89
Volume (vol) vol.112
Number (no) 429
Page pp.pp.-
#Pages 6
Date of Issue