| Presentation | 2013-02-13 Temperature and voltage estimation considering manufacturing variability for a monitoring circuit Yousuke MIYAKE, Wataru TSUMORI, Yasuo SATO, Seui KAJIHARA, Yukiya MIURA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Delay increase due to aging phenomena is a critical issue of VLSIs For detecting such increase in field, a highly accurate delay measurement technology that considers the influence by temperature and voltage is strongly needed A method has been proposed that estimates chip temperature and voltage using a ring-oscillator-based monitonng circuit However, frequencies of the ring-oscillators are greatly influenced by process vanation Thus, we need to take into account the process variation for the accurate estimation of temperature and voltage. This paper discusses estimation of temperature and voltage considenng process variation for the momtonng circuit. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Delay measurement / Aging / Field test / Temperature and Voltage monitor / Ring Oscillator |
| Paper # | DC2012-89 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2013/2/6(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Temperature and voltage estimation considering manufacturing variability for a monitoring circuit |
| Sub Title (in English) | |
| Keyword(1) | Delay measurement |
| Keyword(2) | Aging |
| Keyword(3) | Field test |
| Keyword(4) | Temperature and Voltage monitor |
| Keyword(5) | Ring Oscillator |
| 1st Author's Name | Yousuke MIYAKE |
| 1st Author's Affiliation | Kyushu Institute of Technology:JST, CREST() |
| 2nd Author's Name | Wataru TSUMORI |
| 2nd Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| 3rd Author's Name | Yasuo SATO |
| 3rd Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| 4th Author's Name | Seui KAJIHARA |
| 4th Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| 5th Author's Name | Yukiya MIURA |
| 5th Author's Affiliation | Tokyo Metropolitan University:JST, CREST |
| Date | 2013-02-13 |
| Paper # | DC2012-89 |
| Volume (vol) | vol.112 |
| Number (no) | 429 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |