Presentation 2013-02-13
On Fault detection method considering adjacent TSVs for a delay fault in TSV
Masanori NAKAMURA, Hiroyuki YOTSUYANAGI, Masaki HASHIZUME,
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Abstract(in English) We propose a fault detection method for a TSV (through-Silicon via) considering adjacent TSVs for detecting delay caused by an open TSV Since delay caused by an open TSV is usually very small, it is difficult to detect However, the signal at an open TSV is strongly affected by crosstalk compared with a fault-free TSV In this paper, we propose a fault detection circuit for detecting delay caused by an open TSV that can provide appropriate signals to adjacent TSVs to increase delay at the open TSV, and can measure the increased delay by a delay detection circuit inside an IC In order to estimate the resolution of the delay detection circuit, we also analyze the delay caused by an open TSV using electromagnetic simulation In addition, we also evaluate the effect on delay at each TSV caused by the timing difference among transition signals provided for adjacent TSVs by the proposed circuit.
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Keyword(in English) TSV / design for testability / delay fault
Paper # DC2012-85
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Committee DC
Conference Date 2013/2/6(1days)
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Paper Information
Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) On Fault detection method considering adjacent TSVs for a delay fault in TSV
Sub Title (in English)
Keyword(1) TSV
Keyword(2) design for testability
Keyword(3) delay fault
1st Author's Name Masanori NAKAMURA
1st Author's Affiliation Graduate School of Advanced Technology and Science, Univ of Tokushima()
2nd Author's Name Hiroyuki YOTSUYANAGI
2nd Author's Affiliation Institute of Technology and Science, Univ of Tokushima
3rd Author's Name Masaki HASHIZUME
3rd Author's Affiliation Institute of Technology and Science, Univ of Tokushima
Date 2013-02-13
Paper # DC2012-85
Volume (vol) vol.112
Number (no) 429
Page pp.pp.-
#Pages 6
Date of Issue