Presentation | 2013-02-13 On Fault detection method considering adjacent TSVs for a delay fault in TSV Masanori NAKAMURA, Hiroyuki YOTSUYANAGI, Masaki HASHIZUME, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We propose a fault detection method for a TSV (through-Silicon via) considering adjacent TSVs for detecting delay caused by an open TSV Since delay caused by an open TSV is usually very small, it is difficult to detect However, the signal at an open TSV is strongly affected by crosstalk compared with a fault-free TSV In this paper, we propose a fault detection circuit for detecting delay caused by an open TSV that can provide appropriate signals to adjacent TSVs to increase delay at the open TSV, and can measure the increased delay by a delay detection circuit inside an IC In order to estimate the resolution of the delay detection circuit, we also analyze the delay caused by an open TSV using electromagnetic simulation In addition, we also evaluate the effect on delay at each TSV caused by the timing difference among transition signals provided for adjacent TSVs by the proposed circuit. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | TSV / design for testability / delay fault |
Paper # | DC2012-85 |
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Committee | DC |
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Conference Date | 2013/2/6(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | On Fault detection method considering adjacent TSVs for a delay fault in TSV |
Sub Title (in English) | |
Keyword(1) | TSV |
Keyword(2) | design for testability |
Keyword(3) | delay fault |
1st Author's Name | Masanori NAKAMURA |
1st Author's Affiliation | Graduate School of Advanced Technology and Science, Univ of Tokushima() |
2nd Author's Name | Hiroyuki YOTSUYANAGI |
2nd Author's Affiliation | Institute of Technology and Science, Univ of Tokushima |
3rd Author's Name | Masaki HASHIZUME |
3rd Author's Affiliation | Institute of Technology and Science, Univ of Tokushima |
Date | 2013-02-13 |
Paper # | DC2012-85 |
Volume (vol) | vol.112 |
Number (no) | 429 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |