Electronics-Integrated Circuits and Devices(Date:1994/11/24)

Presentation
表紙

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[Date]1994/11/24
[Paper #]
目次

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[Date]1994/11/24
[Paper #]
Fault detection of CMOS static RAM based on quiescent supply current during write operation

Kiyoshige Taga,  Masaki Hashizume,  Takeshi Koyama,  Takeomi Tamesada,  

[Date]1994/11/24
[Paper #]ICD94-138
Built-in Self Test Based on Chaotic Phenomena

Takeshi Kawashima,  Hiroaki Tanaka,  Shigeyuki Akita,  Tadashi Hatori,  

[Date]1994/11/24
[Paper #]ICD94-139
16M bit Synchronous DRAM with 64 bit data compressed Test Mode

Seiji Sawada,  Hisashi Iwamoto,  Takashi Araki,  Yasumitsu Murai,  Yasuhiro Konishi,  Masaki Kumanoya,  

[Date]1994/11/24
[Paper #]ICD94-140
The development of test simulation for efficient test engineering

Naoyuki Shinonaga,  Katsuya Furue,  Yoshinori Deguchi,  Katsunori Horie,  Yuuji Matsui,  Ryouichi Takagi,  Tetsuo Tada,  

[Date]1994/11/24
[Paper #]ICD94-141
Method of Test Analog-Waveform Synthesis Based on Digital Filtering for Mixed-Signal LSI

Hiroshi Noda,  Harufusa Kondoh,  Tetsuo Tada,  

[Date]1994/11/24
[Paper #]ICD94-142
Multi-Chip Module and Known Good Die Process

Yutaka Tsukada,  

[Date]1994/11/24
[Paper #]ICD94-143
Differential transmissionline TDR mesurement with the Vector network analyzer.

Masahiro Samejima,  

[Date]1994/11/24
[Paper #]ICD94-144
Development of MCM-L and its technologies

Yutaka Tsukada,  

[Date]1994/11/24
[Paper #]ICD94-145
A low-cost silicon-on-silicon MCM

Teruo Kusaka,  Atsushi Nishizawa,  

[Date]1994/11/24
[Paper #]ICD94-146
[OTHERS]

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[Date]1994/11/24
[Paper #]