Presentation 1994/11/24
Fault detection of CMOS static RAM based on quiescent supply current during write operation
Kiyoshige Taga, Masaki Hashizume, Takeshi Koyama, Takeomi Tamesada,
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Abstract(in English) In this paper,a fault detection method for CMOS static RAM is proposed.The method is based on quiescent supply current,which flows during the write operation.From some experiments,it is found that the 60% of faulty SRAM ICs can be detectded by the method. Since the number of the test input vector can be decrease drastically,it is shown that if the method is used before any functional testing,the results of the functional testing can be obtained more quickly.
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Keyword(in English) CMOS / SRAM / supply current test / functional test / I_DDQ>
Paper # ICD94-138
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Conference Date 1994/11/24(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fault detection of CMOS static RAM based on quiescent supply current during write operation
Sub Title (in English)
Keyword(1) CMOS
Keyword(2) SRAM
Keyword(3) supply current test
Keyword(4) functional test
Keyword(5) I_DDQ>
1st Author's Name Kiyoshige Taga
1st Author's Affiliation Faculty of Engineering,The University of Tokushima()
2nd Author's Name Masaki Hashizume
2nd Author's Affiliation Faculty of Engineering,The University of Tokushima
3rd Author's Name Takeshi Koyama
3rd Author's Affiliation Faculty of Engineering,Tokushima Bunri University
4th Author's Name Takeomi Tamesada
4th Author's Affiliation Faculty of Engineering,The University of Tokushima
Date 1994/11/24
Paper # ICD94-138
Volume (vol) vol.94
Number (no) 360
Page pp.pp.-
#Pages 8
Date of Issue