Presentation | 1994/11/24 Fault detection of CMOS static RAM based on quiescent supply current during write operation Kiyoshige Taga, Masaki Hashizume, Takeshi Koyama, Takeomi Tamesada, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In this paper,a fault detection method for CMOS static RAM is proposed.The method is based on quiescent supply current,which flows during the write operation.From some experiments,it is found that the 60% of faulty SRAM ICs can be detectded by the method. Since the number of the test input vector can be decrease drastically,it is shown that if the method is used before any functional testing,the results of the functional testing can be obtained more quickly. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | CMOS / SRAM / supply current test / functional test / I_DDQ> |
Paper # | ICD94-138 |
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Committee | ICD |
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Conference Date | 1994/11/24(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Fault detection of CMOS static RAM based on quiescent supply current during write operation |
Sub Title (in English) | |
Keyword(1) | CMOS |
Keyword(2) | SRAM |
Keyword(3) | supply current test |
Keyword(4) | functional test |
Keyword(5) | I_DDQ> |
1st Author's Name | Kiyoshige Taga |
1st Author's Affiliation | Faculty of Engineering,The University of Tokushima() |
2nd Author's Name | Masaki Hashizume |
2nd Author's Affiliation | Faculty of Engineering,The University of Tokushima |
3rd Author's Name | Takeshi Koyama |
3rd Author's Affiliation | Faculty of Engineering,Tokushima Bunri University |
4th Author's Name | Takeomi Tamesada |
4th Author's Affiliation | Faculty of Engineering,The University of Tokushima |
Date | 1994/11/24 |
Paper # | ICD94-138 |
Volume (vol) | vol.94 |
Number (no) | 360 |
Page | pp.pp.- |
#Pages | 8 |
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