Presentation | 1994/11/24 Method of Test Analog-Waveform Synthesis Based on Digital Filtering for Mixed-Signal LSI Hiroshi Noda, Harufusa Kondoh, Tetsuo Tada, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | For the functional testing of mixed-signal LSIs,it is very important to characterize and test tht LSI with complex input signal waveforms which represent degradation by an actual telecommunication line.A new efficient method to generate degraded waveforms,additional reflections,and distortions caused by the telecommunication line is described.The method is based on the Finite Impulse Response (FIR) filtering which obtains digital calculation of filter coefficients and square shaped ideal input pulses.The filter coefficients are derived from differentiating the step response of the telecommunication line,i.e.the degraded waveform of the isolated pulse.The square shaped ideal input pulses are easily derived from the digital test pattern.The time required to generate the degraded input waveforms was about 100 times faster than the conventional method.This method has satisfied the degraded input waveforms of the spcified by the ITU- T recommendation I.430. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | input signal waveform / reflection / distortion / FIR filtering / filter coefficient |
Paper # | ICD94-142 |
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Conference Information | |
Committee | ICD |
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Conference Date | 1994/11/24(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Method of Test Analog-Waveform Synthesis Based on Digital Filtering for Mixed-Signal LSI |
Sub Title (in English) | |
Keyword(1) | input signal waveform |
Keyword(2) | reflection |
Keyword(3) | distortion |
Keyword(4) | FIR filtering |
Keyword(5) | filter coefficient |
1st Author's Name | Hiroshi Noda |
1st Author's Affiliation | System LSI Laboratory,Mitsubishi Electric Corporation() |
2nd Author's Name | Harufusa Kondoh |
2nd Author's Affiliation | System LSI Laboratory,Mitsubishi Electric Corporation |
3rd Author's Name | Tetsuo Tada |
3rd Author's Affiliation | System LSI Laboratory,Mitsubishi Electric Corporation |
Date | 1994/11/24 |
Paper # | ICD94-142 |
Volume (vol) | vol.94 |
Number (no) | 360 |
Page | pp.pp.- |
#Pages | 8 |
Date of Issue |