Engineering Sciences/NOLTA-Hardware Security(Date:2020/03/04)

Presentation
Image edge detection using Latest Results based Approximate Computing

Hajime Ochi(SIT),  Kimiyoshi Usami(SIT),  

[Date]2020-03-05
[Paper #]VLD2019-121,HWS2019-94
[Memorial Lecture] Small-Area and Low-Power FPGA-Based Multipliers using Approximate Elementary Modules

Yi Guo(Waseda Univ.),  Heming Sun(Waseda Univ.),  Shinji Kimura(Waseda Univ.),  

[Date]2020-03-05
[Paper #]VLD2019-117,HWS2019-90
[Memorial Lecture] A Tuning-Free Hardware Reservoir Based on MOSFET Crossbar Array for Practical Echo State Network Implementation

Yuki Kume(Kyoto Univ.),  Song Bian(Kyoto Univ.),  Takashi Sato(Kyoto Univ.),  

[Date]2020-03-05
[Paper #]VLD2019-118,HWS2019-91
A Study of A H/W-S/W Co-design Method to Make Effective Utilization of System Resources

Fumitoshi Karube(MELCO),  Shunsuke Tatsumi(MELCO),  Naoya Okada(MELCO),  Ryo Yamamoto(MELCO),  Yoshihiro Ogawa(MELCO),  Abraham Goldsmith(MERL),  Rien Quirynen(MERL),  

[Date]2020-03-05
[Paper #]VLD2019-116,HWS2019-89
NA

Masashi Tawada(Waseda Univ.),  Nozomu Togawa(Waseda Univ.),  

[Date]2020-03-05
[Paper #]VLD2019-122,HWS2019-95
Motor Current Signature Analysis Based On-Line Fault Detection of DC Motor

Naoki Osako(Kwansei Gakuin Univ.),  Hiroyuki Kanbara(ASTEM),  Nagisa Ishiura(Kwansei Gakuin Univ.),  

[Date]2020-03-05
[Paper #]VLD2019-111,HWS2019-84
stochasitc fast estimation of timing error induced circuit lifetime distribution

Hazuki Tomiyama(Nagoya Univ.),  Yutaka Masuda(Nagoya Univ.),  Tohru Ishihara(Nagoya Univ.),  

[Date]2020-03-05
[Paper #]VLD2019-113,HWS2019-86
A Study Toward Binary Code Generation Using Neural Programmer-Interpreters

Masahiko Tsuyama(Meiji Univ.),  Ryusuke Miyamoto(Meiji Univ.),  

[Date]2020-03-05
[Paper #]VLD2019-115,HWS2019-88
Hardware Control from Erlang Programs on Programmable SoC

Hidekazu Wakabayashi(Kwansei Gakuin Univ.),  Nagisa Ishiura(Kwnsei Gakuin Univ.),  

[Date]2020-03-05
[Paper #]VLD2019-114,HWS2019-87
A Study of FPGA Architectures for Deep Neural Network in Control devices

Ryo Yamamoto(Mitsubishi Electric),  Hidetomo Iwagawa(Mitsubishi Electric),  Yoshihiro Ogawa(Mitsubishi Electric),  

[Date]2020-03-06
[Paper #]VLD2019-135,HWS2019-108
A Consideration on Efficient Anomaly Detection Based on Isolation Forest

Tsubasa Ikeda(HCU),  Shinobu Nagayama(HCU),  Masato Inagi(HCU),  Shin'ichi Wakabayashi(HCU),  

[Date]2020-03-06
[Paper #]VLD2019-125,HWS2019-98
NA

Tomotaka Inoue(Waseda Univ.),  Kento Hasegawa(Waseda Univ.),  Nozomu Togawa(Waseda Univ.),  

[Date]2020-03-06
[Paper #]VLD2019-133,HWS2019-106
N/A

Yosuke Mukasa(Waseda Univ.),  Tomoya Wakaizumi(Waseda Univ.),  Shu Tanaka(Waseda Univ.),  Nozomu Togawa(Waseda Univ.),  

[Date]2020-03-06
[Paper #]VLD2019-123,HWS2019-96
Circuit Architecture Exploration for Optical Neural Network based on Integrated Nanophotonics

Naoki Hattori(Nagoya Univ.),  Yutaka Masuda(Nagoya Univ.),  Tohru Ishihara(Nagoya Univ.),  Jun Shiomi(Kyoto Univ.),  Akihiko Shinya(NTT),  Masaya Notomi(NTT),  

[Date]2020-03-06
[Paper #]VLD2019-137,HWS2019-110
Development of Traffic Monitoring System for Network Virtualization with Hardware Accelerator

Namiko Ikeda(NTT),  Yuta Ukon(NTT),  Shouko Ohteru(NTT),  Shuhei Yoshida(NTT),  Koyo Nitta(NTT),  

[Date]2020-03-06
[Paper #]VLD2019-127,HWS2019-100
Design Space Search for Faster Fp256 Elliptic Curve Cryptography

Kento Ikeda(Tokyo Univ.),  Makoto Ikeda(d.lab),  

[Date]2020-03-06
[Paper #]VLD2019-130,HWS2019-103
A Test Generation Method for Resistive Open Faults Using Partial MAX-SAT solver

Hiroshi Yamazaki(Nihon Univ.),  Yuta Ishiyama(Nihon Univ.),  Tatsuma Matsuta(Nihon Univ.),  Toshinori Hosokawa(Nihon Univ.),  Masayoshi Yoshimura(Kyoto Sangyo Univ.),  Masayuki Arai(Nihon Univ.),  Hiroyuki Yotsuyanagi(Tokushima Univ.),  Masaki Hashizume(Tokushima Univ.),  

[Date]2020-03-06
[Paper #]VLD2019-131,HWS2019-104
A Study on Acceleration of Convolution using Bit-serial Dot Product Units with Zero-bit Skipping

Sora Isobe(UoA),  Yoichi Tomioka(UoA),  

[Date]2020-03-06
[Paper #]VLD2019-134,HWS2019-107
Fundamental Study on Fault Analysis with Non-Uniform Faulty Values Caused at Fault Injection into Sequential Circuit

Takumi Okamoto(NAIST),  Daisuke Fujimoto(NAIST),  Kazuo Sakiyama(UEC),  Li Yang(UEC),  Yu-ichi Hayashi(NAIST),  

[Date]2020-03-06
[Paper #]VLD2019-128,HWS2019-101
選択的な低処理遅延データ圧縮による高バンド幅相互結合網

Naoya Niwa(Keio Univ.),  Shoichi Hirasawa(NII),  Michihiro Koibuchi(NII),  Hideharu Amano(Keio Univ.),  

[Date]2020-03-06
[Paper #]VLD2019-126,HWS2019-99
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