Electronics-Component Parts and Materials(Date:2001/07/26)

Presentation
表紙

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[Date]2001/7/26
[Paper #]
目次

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[Date]2001/7/26
[Paper #]
Electrical properties and structure of titanium oxide thin films formed by metalorganic decomposition.

Shinichi MAEDA,  Hisashi FUKUDA,  Shigeru NOMURA,  

[Date]2001/7/26
[Paper #]CPM2001-40
Structural and electric properties of Y_2O_3 thin films formed by Metal-organic decomposition

Shunpei HONMA,  Hisashi FUKUDA,  Shigeru NOMURA,  

[Date]2001/7/26
[Paper #]CPM2001-41
Fundamental behavior of vacancies attributed to stress-induced migration

Minoru Aoyagi,  

[Date]2001/7/26
[Paper #]CPM2001-42
AFM observations of epitaxially grown(III)HfN film and (III)Cu/(III)HfN bilayered film on (III)Si

Satoko SHINKAI,  Katsutaka SASAKI,  

[Date]2001/7/26
[Paper #]CPM2001-43
Optical and electrical characteristics of Ge nanocrystals in SiO_2 film

Shin-ichi MATSUNAGA,  Hisashi FUKUDA,  Shigeru NOMURA,  Motokazu NISHINO,  

[Date]2001/7/26
[Paper #]CPM2001-144
Structure and Electrical Properties of In-Doped ZnS Films Prepared by Radio-Frequency Magnetron Sputtering

Tomoaki SUGAWARA,  Isao SHIMONO,  Hisashi FUKUDA,  MAsaki YOSHINO,  Motokazu NISHINO,  Shigeru NOMURA,  

[Date]2001/7/26
[Paper #]CPM2001-45
Pt-Wo_3 Gate MOSFET Sensor For CO Gas Sensor

Tetsuya NAGAHORI,  Hisashi FUKUDA,  Shigeru NOMURA,  

[Date]2001/7/26
[Paper #]CPM2001-46
[OTHERS]

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[Date]2001/7/26
[Paper #]