Presentation 2001/7/26
Structure and Electrical Properties of In-Doped ZnS Films Prepared by Radio-Frequency Magnetron Sputtering
Tomoaki SUGAWARA, Isao SHIMONO, Hisashi FUKUDA, MAsaki YOSHINO, Motokazu NISHINO, Shigeru NOMURA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In-doped ZnS films prepared using RF maqnetron sputtering have been investigated by X-ray diffraction(XRD), scanning electron microscopy(SEM), Hall measurement, optical transmission spectra measurement, Auger electron spectroscopy(AES) and X-ray photoelectron spectroscopy(XPS). The XRD results indicated the film prepared at argon(Ar)gas pressure of 1mTorr was ZnS with crystal structure of wurtzite or zinc blend. The composition of the film prepared at Ar gas pressure of 4mTorr was Zn_<1.00>In_<0.07>S_<0.14>O_<0.85> using AES results. The AES and XRD data indicated that the structure close to wurtzite of ZnO than zinc blend of ZnS is obtained for Ar gas pressure of 3-5 mTorr in the sputtering. The result of Hall measurement showed the resistivity of 0.01Ω・cm, the carrier concentration of 2×10^<20>cm^3 and the mobility of 2-5cm^2/V^<-1>/s^<-1> for the films prepared at Ar gas pressure of 3-5mTorr.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) zinc sulfide / indium doping / film / sputtering / structure / conductivity
Paper # CPM2001-45
Date of Issue

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Committee CPM
Conference Date 2001/7/26(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Structure and Electrical Properties of In-Doped ZnS Films Prepared by Radio-Frequency Magnetron Sputtering
Sub Title (in English)
Keyword(1) zinc sulfide
Keyword(2) indium doping
Keyword(3) film
Keyword(4) sputtering
Keyword(5) structure
Keyword(6) conductivity
1st Author's Name Tomoaki SUGAWARA
1st Author's Affiliation Hokkaido Industrial Technology Center()
2nd Author's Name Isao SHIMONO
2nd Author's Affiliation Hokkaido Industrial Technology Center
3rd Author's Name Hisashi FUKUDA
3rd Author's Affiliation Muroran Institute of Technology
4th Author's Name MAsaki YOSHINO
4th Author's Affiliation Hokkaido Polytechnic College
5th Author's Name Motokazu NISHINO
5th Author's Affiliation Hokkaido Polytechnic College
6th Author's Name Shigeru NOMURA
6th Author's Affiliation Muroran Institute of Technology
Date 2001/7/26
Paper # CPM2001-45
Volume (vol) vol.101
Number (no) 244
Page pp.pp.-
#Pages 6
Date of Issue