Presentation | 2001/7/26 Structural and electric properties of Y_2O_3 thin films formed by Metal-organic decomposition Shunpei HONMA, Hisashi FUKUDA, Shigeru NOMURA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Yttrium oxide(Y_2O_3)thin films were formed by metal-organic decomposition(MOD). The Y_2O_3 thin films were well crystallized after 600℃ annealing in oxygen atmosphere. The surface morphology indicates polycrystalline structure with small grains. The Y_2O_3 thin films after 900℃ annealing indicates the dielectric constant of 11 in maximum and leakage current of 10^<-5> A/cm^2 order at 5MV/cm. Next, thinning of the films were carried out by addition of butyl acetate in the MOD. Thin Y_2O_3 films indicates the crystallinity degradation and the decrease of dielectric constants. Low leakage current of 10^<-7> A/cm^2 and higher breakdown strength of 7 MV/cm for well optimized addition of butyl acetate. Minimum equivalent thickness of 6.8 nm was obtained for thin Y_2O_3 films. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | metal-organic decomposition / Y_2O_3 / thin films / gate dielectrics / MOFET |
Paper # | CPM2001-41 |
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Conference Information | |
Committee | CPM |
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Conference Date | 2001/7/26(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Component Parts and Materials (CPM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Structural and electric properties of Y_2O_3 thin films formed by Metal-organic decomposition |
Sub Title (in English) | |
Keyword(1) | metal-organic decomposition |
Keyword(2) | Y_2O_3 |
Keyword(3) | thin films |
Keyword(4) | gate dielectrics |
Keyword(5) | MOFET |
1st Author's Name | Shunpei HONMA |
1st Author's Affiliation | Department of Electrical and Electronic Engineering, Faculty of Engineering, Muroran Institute of Technology() |
2nd Author's Name | Hisashi FUKUDA |
2nd Author's Affiliation | Department of Electrical and Electronic Engineering, Faculty of Engineering, Muroran Institute of Technology |
3rd Author's Name | Shigeru NOMURA |
3rd Author's Affiliation | Department of Electrical and Electronic Engineering, Faculty of Engineering, Muroran Institute of Technology |
Date | 2001/7/26 |
Paper # | CPM2001-41 |
Volume (vol) | vol.101 |
Number (no) | 244 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |