Information and Systems-Dependable Computing(Date:2021/02/05)

Presentation
相互依存システムにおける耐性強化問題の高速化

Daichi Minamide(Osaka Univ.),  Tatsuhiro Tsuchiya(Osaka Univ.),  

[Date]2021-02-05
[Paper #]DC2020-79
A Novel High Performance Scan-Test-Aware Hardened Latch Design

Ruijun Ma(KIT),  Stefan Holst(KIT),  Xiaoqing Wen(KIT),  Aibin Yan(AHU),  Hui Xu(AUST),  

[Date]2021-02-05
[Paper #]DC2020-71
A Don't Care Filling Method of Control Signals Based on Non-scan Field Testability at Register Transfer Level

Yuki Ikegaya(Nihon Univ.),  Yuta Ishiyama(Nihon Univ.),  Toshinori Hosokawa(Nihon Univ.),  Masayoshi Yoshimura(Kyoto Sangyo Univ.),  

[Date]2021-02-05
[Paper #]DC2020-77
A Test Generation Method Using Information of Easily Testable Functional Time Expansion Model

Kenta Nakamura(Nihon Univ.),  Yuta Ishiyama(Nihon Univ.),  Toshinori Hosokawa(Nihon Univ.),  

[Date]2021-02-05
[Paper #]DC2020-76
Locating High Power Consuming Area in Logic parts Caused by Memory Size and Shapes

Daiki Takafuji(Kyutech),  Ryu Hoshino(Kyutech),  Kohei Miyase(Kyutech),  Xiaoqing Wen(Kyutech),  Seiji Kajihara(Kyutech),  

[Date]2021-02-05
[Paper #]DC2020-72
Multiple Target Test Generation Method using Test Scheduling Information of RTL Hardware Elements

Ryuki Asami(Nihon Univ),  Toshinori Hosokawa(Nihon Univ),  Hiroshi Yamazaki(Nihon Univ),  Masayoshi Yoshimura(Kyoto Sangyo Univ),  Masayuki Arai(Nihon Univ),  

[Date]2021-02-05
[Paper #]DC2020-74
CANバス上の単一ビットエラーによるオーバヘッドの考察

Ryohei Satoh(Tokyo Metropolitan Univ.),  Tomoki Kitabayashi(Tokyo Metropolitan Univ.),  Satoshi Fukumoto(Tokyo Metropolitan Univ.),  

[Date]2021-02-05
[Paper #]DC2020-78
Hardware Trojan Detection by Learning Power Side Channel Signals Considering Random Process Variation

Michiko Inoue(NAIST),  Riaz-Ul-Haque Mian(NAIST),  

[Date]2021-02-05
[Paper #]DC2020-70
A Study on a Method of Measuring Process Variations Considering the Effect of Wire Delay on FPGA

Shingo Tsutsumi(Tokyo Metropolitan Univ.),  Yukiya Miura(Tokyo Metropolitan Univ.),  

[Date]2021-02-05
[Paper #]DC2020-69
Fault Coverage Estimation Method in Multi-Cycle Testing

Norihiro Nakaoka(Ehime Univ.),  Senling Wang(Ehime Univ.),  Yoshinobu Higami(Ehime Univ.),  Hiroshi Takahashi(Ehime Univ.),  Hiroyuki Iwata(Renesas Electronics Corp.),  Yoichi Maeda(Renesas Electronics Corp.),  Jun Matsushima(Renesas Electronics Corp.),  

[Date]2021-02-05
[Paper #]DC2020-75
CNNによるLSIレイアウト画像分類におけるデータ拡張手法の検討

Kai Murakawa(Tokyo Metropolitan Univ.),  Yoshikazu Nagamura(Tokyo Metropolitan Univ.),  Masayuki Arai(Nihon Univ.),  Satoshi Fukumoto(Tokyo Metropolitan Univ.),  

[Date]2021-02-05
[Paper #]DC2020-73