Presentation 2021-02-05
A Test Generation Method Using Information of Easily Testable Functional Time Expansion Model
Kenta Nakamura, Yuta Ishiyama, Toshinori Hosokawa,
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Abstract(in English)
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Keyword(in English)
Paper # DC2020-76
Date of Issue 2021-01-29 (DC)

Conference Information
Committee DC
Conference Date 2021/2/5(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
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Chair Hiroshi Takahashi(Ehime Univ.)
Vice Chair Tatsuhiro Tsuchiya(Osaka Univ.)
Secretary Tatsuhiro Tsuchiya(Nihon Univ.)
Assistant

Paper Information
Registration To Technical Committee on Dependable Computing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Test Generation Method Using Information of Easily Testable Functional Time Expansion Model
Sub Title (in English)
Keyword(1)
1st Author's Name Kenta Nakamura
1st Author's Affiliation Nihon University(Nihon Univ.)
2nd Author's Name Yuta Ishiyama
2nd Author's Affiliation Nihon University(Nihon Univ.)
3rd Author's Name Toshinori Hosokawa
3rd Author's Affiliation Nihon University(Nihon Univ.)
Date 2021-02-05
Paper # DC2020-76
Volume (vol) vol.120
Number (no) DC-358
Page pp.pp.42-47(DC),
#Pages 6
Date of Issue 2021-01-29 (DC)