Presentation 2021-02-05
A Study on a Method of Measuring Process Variations Considering the Effect of Wire Delay on FPGA
Shingo Tsutsumi, Yukiya Miura,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) FPGAs are integrated circuits that can be implemented arbitrary logic functions. In FPGAs, it is important to measure process variations with high accuracy because process variations have become noticeable. A ring oscillator is widely used as a process monitor circuit. In FPGA design, the wires between logic blocks and signal paths inside logic blocks are automatically determined by a design tool when a circuit is implemented. Designers can redesign logic block parts, however they cannot redesign wire parts. Therefore, in order to measure process variations with high accuracy, it is necessary to clarify the effect of wire delay on an oscillation frequency. Ring oscillators with different wires between logic blocks are implemented on the FPGA and a method for measuring process variations with less effect of wire delay is considered.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) FPGA / Ring Oscillators / Oscillation Frequency / Wire Delay / Process Variations
Paper # DC2020-69
Date of Issue 2021-01-29 (DC)

Conference Information
Committee DC
Conference Date 2021/2/5(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Hiroshi Takahashi(Ehime Univ.)
Vice Chair Tatsuhiro Tsuchiya(Osaka Univ.)
Secretary Tatsuhiro Tsuchiya(Nihon Univ.)
Assistant

Paper Information
Registration To Technical Committee on Dependable Computing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study on a Method of Measuring Process Variations Considering the Effect of Wire Delay on FPGA
Sub Title (in English)
Keyword(1) FPGA
Keyword(2) Ring Oscillators
Keyword(3) Oscillation Frequency
Keyword(4) Wire Delay
Keyword(5) Process Variations
1st Author's Name Shingo Tsutsumi
1st Author's Affiliation Tokyo Metropolitan University(Tokyo Metropolitan Univ.)
2nd Author's Name Yukiya Miura
2nd Author's Affiliation Tokyo Metropolitan University(Tokyo Metropolitan Univ.)
Date 2021-02-05
Paper # DC2020-69
Volume (vol) vol.120
Number (no) DC-358
Page pp.pp.1-6(DC),
#Pages 6
Date of Issue 2021-01-29 (DC)