| Presentation | 2021-02-05 A Novel High Performance Scan-Test-Aware Hardened Latch Design Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | As modern technology nodes become more and more susceptible to soft-errors, many radiation hardened latch designs have been proposed for reliable LSI designs. Production defects in such hardened latches are difficult to detect with conventional scan testing. In our previous work, we proposed a scan-test-aware hardened latch (STAHL) design which can tolerate soft-errors and has high defect coverage. However, STAHL has higher power and delay overhead than other hardened latches in the literature. In this paper, we propose a novel high performance and scan-test-aware hardened latch (HP-STAHL). Simulation results show that HP-STAHL provides for the first time the same benefits as STAHL in terms of soft-error tolerance and testability. HP-STAHL has lower delay and power delay product (PDP) than a standard latch, which shows that HP-STAHL has high performance. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | soft-errorscan testhardened latchdefect |
| Paper # | DC2020-71 |
| Date of Issue | 2021-01-29 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2021/2/5(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Hiroshi Takahashi(Ehime Univ.) |
| Vice Chair | Tatsuhiro Tsuchiya(Osaka Univ.) |
| Secretary | Tatsuhiro Tsuchiya(Nihon Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Novel High Performance Scan-Test-Aware Hardened Latch Design |
| Sub Title (in English) | |
| Keyword(1) | soft-errorscan testhardened latchdefect |
| 1st Author's Name | Ruijun Ma |
| 1st Author's Affiliation | Kyushu Institute of Technology(KIT) |
| 2nd Author's Name | Stefan Holst |
| 2nd Author's Affiliation | Kyushu Institute of Technology(KIT) |
| 3rd Author's Name | Xiaoqing Wen |
| 3rd Author's Affiliation | Kyushu Institute of Technology(KIT) |
| 4th Author's Name | Aibin Yan |
| 4th Author's Affiliation | Anhui University(AHU) |
| 5th Author's Name | Hui Xu |
| 5th Author's Affiliation | Anhui University of Science & Technology(AUST) |
| Date | 2021-02-05 |
| Paper # | DC2020-71 |
| Volume (vol) | vol.120 |
| Number (no) | DC-358 |
| Page | pp.pp.12-17(DC), |
| #Pages | 6 |
| Date of Issue | 2021-01-29 (DC) |