| Presentation | 2021-02-05 A Don't Care Filling Method of Control Signals Based on Non-scan Field Testability at Register Transfer Level Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa, Masayoshi Yoshimura, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A field testing that monitors the values of circuit outputs and internal signal lines during function mode is used as one of the means to avoid failures due to aging of VLSIs. Especially, VLSIs on automobiles needs to be tested in a short time when the engines are started, using built-in self-test. In built-in self-test, scan design which can obtain high fault coverage is generally used. However, there are problems such as large area overhead and long test execution time compared to non-scan design. In non-scan design-based field testing, a status signal sequence generation method to execute each state transition of the controller at least n times was proposed. In this paper, we propose a don't care filling method for control signals to increase fault coverage in field testing. In the proposed method, a structural symbolic simulation is performed with status signal sequences for n state transition cover, hardware elements which have not been tested are identified, and logic values are assigned to don't cares in control signals to test the hardware elements. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | field testing / non-scan design / structural symbolic simulation / control signals / don’t care filling |
| Paper # | DC2020-77 |
| Date of Issue | 2021-01-29 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2021/2/5(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Hiroshi Takahashi(Ehime Univ.) |
| Vice Chair | Tatsuhiro Tsuchiya(Osaka Univ.) |
| Secretary | Tatsuhiro Tsuchiya(Nihon Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Don't Care Filling Method of Control Signals Based on Non-scan Field Testability at Register Transfer Level |
| Sub Title (in English) | |
| Keyword(1) | field testing |
| Keyword(2) | non-scan design |
| Keyword(3) | structural symbolic simulation |
| Keyword(4) | control signals |
| Keyword(5) | don’t care filling |
| 1st Author's Name | Yuki Ikegaya |
| 1st Author's Affiliation | Nihon University(Nihon Univ.) |
| 2nd Author's Name | Yuta Ishiyama |
| 2nd Author's Affiliation | Nihon University(Nihon Univ.) |
| 3rd Author's Name | Toshinori Hosokawa |
| 3rd Author's Affiliation | Nihon University(Nihon Univ.) |
| 4th Author's Name | Masayoshi Yoshimura |
| 4th Author's Affiliation | Kyoto Sangyo University(Kyoto Sangyo Univ.) |
| Date | 2021-02-05 |
| Paper # | DC2020-77 |
| Volume (vol) | vol.120 |
| Number (no) | DC-358 |
| Page | pp.pp.48-53(DC), |
| #Pages | 6 |
| Date of Issue | 2021-01-29 (DC) |