Presentation 2021-02-05
A Don't Care Filling Method of Control Signals Based on Non-scan Field Testability at Register Transfer Level
Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa, Masayoshi Yoshimura,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A field testing that monitors the values of circuit outputs and internal signal lines during function mode is used as one of the means to avoid failures due to aging of VLSIs. Especially, VLSIs on automobiles needs to be tested in a short time when the engines are started, using built-in self-test. In built-in self-test, scan design which can obtain high fault coverage is generally used. However, there are problems such as large area overhead and long test execution time compared to non-scan design. In non-scan design-based field testing, a status signal sequence generation method to execute each state transition of the controller at least n times was proposed. In this paper, we propose a don't care filling method for control signals to increase fault coverage in field testing. In the proposed method, a structural symbolic simulation is performed with status signal sequences for n state transition cover, hardware elements which have not been tested are identified, and logic values are assigned to don't cares in control signals to test the hardware elements.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) field testing / non-scan design / structural symbolic simulation / control signals / don’t care filling
Paper # DC2020-77
Date of Issue 2021-01-29 (DC)

Conference Information
Committee DC
Conference Date 2021/2/5(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Hiroshi Takahashi(Ehime Univ.)
Vice Chair Tatsuhiro Tsuchiya(Osaka Univ.)
Secretary Tatsuhiro Tsuchiya(Nihon Univ.)

Paper Information
Registration To Technical Committee on Dependable Computing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Don't Care Filling Method of Control Signals Based on Non-scan Field Testability at Register Transfer Level
Sub Title (in English)
Keyword(1) field testing
Keyword(2) non-scan design
Keyword(3) structural symbolic simulation
Keyword(4) control signals
Keyword(5) don’t care filling
1st Author's Name Yuki Ikegaya
1st Author's Affiliation Nihon University(Nihon Univ.)
2nd Author's Name Yuta Ishiyama
2nd Author's Affiliation Nihon University(Nihon Univ.)
3rd Author's Name Toshinori Hosokawa
3rd Author's Affiliation Nihon University(Nihon Univ.)
4th Author's Name Masayoshi Yoshimura
4th Author's Affiliation Kyoto Sangyo University(Kyoto Sangyo Univ.)
Date 2021-02-05
Paper # DC2020-77
Volume (vol) vol.120
Number (no) DC-358
Page pp.pp.48-53(DC),
#Pages 6
Date of Issue 2021-01-29 (DC)