Presentation 2021-02-05
Fault Coverage Estimation Method in Multi-Cycle Testing
Norihiro Nakaoka, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # DC2020-75
Date of Issue 2021-01-29 (DC)

Conference Information
Committee DC
Conference Date 2021/2/5(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Hiroshi Takahashi(Ehime Univ.)
Vice Chair Tatsuhiro Tsuchiya(Osaka Univ.)
Secretary Tatsuhiro Tsuchiya(Nihon Univ.)
Assistant

Paper Information
Registration To Technical Committee on Dependable Computing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fault Coverage Estimation Method in Multi-Cycle Testing
Sub Title (in English)
Keyword(1)
1st Author's Name Norihiro Nakaoka
1st Author's Affiliation Ehime University(Ehime Univ.)
2nd Author's Name Senling Wang
2nd Author's Affiliation Ehime University(Ehime Univ.)
3rd Author's Name Yoshinobu Higami
3rd Author's Affiliation Ehime University(Ehime Univ.)
4th Author's Name Hiroshi Takahashi
4th Author's Affiliation Ehime University(Ehime Univ.)
5th Author's Name Hiroyuki Iwata
5th Author's Affiliation Renesas Electronics Corporation(Renesas Electronics Corp.)
6th Author's Name Yoichi Maeda
6th Author's Affiliation Renesas Electronics Corporation(Renesas Electronics Corp.)
7th Author's Name Jun Matsushima
7th Author's Affiliation Renesas Electronics Corporation(Renesas Electronics Corp.)
Date 2021-02-05
Paper # DC2020-75
Volume (vol) vol.120
Number (no) DC-358
Page pp.pp.36-41(DC),
#Pages 6
Date of Issue 2021-01-29 (DC)