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2004 International Symposium on Electromagnetic Compatibility
| number | title/author |
|---|---|
| 2A4-1 | Modeling concept for susceptibility behavior in sensor microsystems U. Sturmer, W. John, |
| 2A4-2 | Abstract modeling of signal behaviour in interconnected integrated circuits based on black box approach and model order reduction G. Lubkowski, R. Piesiewicz, W. John, |
| 2A4-3 | Modeling and simulation of conducted emission for VLSI Ics M. Schmidt, H. Kohne, T. Steinecke, |