Summary

International Symposium on Electromagnetic Compatibility

2004

Session Number:2A4

Session:

Number:2A4-3

Modeling and simulation of conducted emission for VLSI Ics

M. Schmidt,  H. Kohne,  T. Steinecke,  

pp.273-276

Publication Date:2004/6/1

Online ISSN:2188-5079

DOI:10.34385/proc.11.2A4-3

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