Information and Systems-Dependable Computing(Date:2009/06/12)

Presentation
表紙

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[Date]2009/6/12
[Paper #]
目次

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[Date]2009/6/12
[Paper #]
Design method of easily testable parallel prefix adders

Hidetoshi SUZUKI,  Nafumi TAKAGI,  

[Date]2009/6/12
[Paper #]DC2009-10
Note on Yield and Area Trade-offs for MBIST in SoC

Masayuki Arai,  Tatsuro Endo,  Kazuhiko Iwasaki,  Michinobu Nakao,  Iwao Suzuki,  

[Date]2009/6/12
[Paper #]DC2009-11
A Test Generation Algorithm Based on 5-valued Logic for Threshold Testing

Nobukazu IZUMI,  Yuki YOSHIKAWA,  Hideyuki ICHIHARA,  Tomoo INOUE,  

[Date]2009/6/12
[Paper #]DC2009-12
Diagnostic Test Generation for Transition Faults Using a Stuck-at ATPG Tool

Yoshinobu HIGAMI,  Yosuke KUROSE,  SATOSHI Ohno,  Hironori YAMAOKA,  Hiroshi TAKAHASHI,  Yoshihiro SHIMIZU,  Takashi AIKYO,  Yuzo TAKAMATSU,  

[Date]2009/6/12
[Paper #]DC2009-13
High-level Design for Test Tools & Industrial Design Flows

Chouki AKTOUF,  

[Date]2009/6/12
[Paper #]DC2009-14
Power & Noise Aware Test Utilizing Preliminary Estimation

Kenji Noda,  Hideaki Ito,  Kazumi Hatayama,  Takashi Aikyo,  

[Date]2009/6/12
[Paper #]DC2009-15
An Area Reduction Technique of Self-testing FFs for Small-delay Defects Detection

Koichiro NOGUCHI,  Koichi NOSE,  Toshinobu ONO,  Masayuki MIZUNO,  

[Date]2009/6/12
[Paper #]DC2009-16
Case study: Fault diagnosis for detecting systematic fault

Hiroshi YAMAMOTO,  Hiroki WADA,  Toru OGUSHI,  Michinobu NAKAO,  

[Date]2009/6/12
[Paper #]DC2009-17
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[Date]2009/6/12
[Paper #]
Notice for photocopying

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[Date]2009/6/12
[Paper #]
奥付

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[Date]2009/6/12
[Paper #]