| Presentation | 2009-06-19 An Area Reduction Technique of Self-testing FFs for Small-delay Defects Detection Koichiro NOGUCHI, Koichi NOSE, Toshinobu ONO, Masayuki MIZUNO, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | As continuous process scaling produces large-scale chips, small-delay defects become one of the major chip-reliability limiters. Small-delay defect detection techniques for LSI screening have been developed, which can successfully detect outlier chips among normally-distributed chips using a self-testing scan-FF. In this paper, Area reduction technique is proposed. As a result, we realized 10% chip area reduction by sharing a part of functions of self-testing FF among the some scan-FF. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Delay defect / Test / Screening / Scan-FF |
| Paper # | DC2009-16 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2009/6/12(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An Area Reduction Technique of Self-testing FFs for Small-delay Defects Detection |
| Sub Title (in English) | |
| Keyword(1) | Delay defect |
| Keyword(2) | Test |
| Keyword(3) | Screening |
| Keyword(4) | Scan-FF |
| 1st Author's Name | Koichiro NOGUCHI |
| 1st Author's Affiliation | Device Platforms Research Laboratories, NEC Corporation() |
| 2nd Author's Name | Koichi NOSE |
| 2nd Author's Affiliation | Device Platforms Research Laboratories, NEC Corporation |
| 3rd Author's Name | Toshinobu ONO |
| 3rd Author's Affiliation | Design Engineering Development Division, NEC Electronics Corporation |
| 4th Author's Name | Masayuki MIZUNO |
| 4th Author's Affiliation | Device Platforms Research Laboratories, NEC Corporation |
| Date | 2009-06-19 |
| Paper # | DC2009-16 |
| Volume (vol) | vol.109 |
| Number (no) | 95 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |