| Presentation | 2009-06-19 A Test Generation Algorithm Based on 5-valued Logic for Threshold Testing Nobukazu IZUMI, Yuki YOSHIKAWA, Hideyuki ICHIHARA, Tomoo INOUE, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | If the existence of a fault in a circuit only causes negligible effect on its application, the fault is said to be acceptable. A method for generating test patterns of unacceptable faults for a given threshold has been presented. The test generation algorithm in the method works based on 16-valued logic, and hence it can tightly evaluate the upper and lower bounds of errors, whereas it may require large computational effort for the implication from every assignment at primary inputs. In this paper, we propose a new threshold test generation algorithm based on 5-valued logic instead of 16-valued one. In order to estimate the upper and lower bounds of errors as tight as possible with small computational effort, the algorithm utilizes the result of X-path checking, which is an essential procedure in the original PODEM, to the error estimation. Experimental results show that the proposed algorithm can generate threshold test patterns with small computational time compared with that based on 16-valued logic. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Acceptable faults / threshold test generation / error significance / PODEM / 5-valued logic |
| Paper # | DC2009-12 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2009/6/12(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Test Generation Algorithm Based on 5-valued Logic for Threshold Testing |
| Sub Title (in English) | |
| Keyword(1) | Acceptable faults |
| Keyword(2) | threshold test generation |
| Keyword(3) | error significance |
| Keyword(4) | PODEM |
| Keyword(5) | 5-valued logic |
| 1st Author's Name | Nobukazu IZUMI |
| 1st Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University() |
| 2nd Author's Name | Yuki YOSHIKAWA |
| 2nd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 3rd Author's Name | Hideyuki ICHIHARA |
| 3rd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 4th Author's Name | Tomoo INOUE |
| 4th Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| Date | 2009-06-19 |
| Paper # | DC2009-12 |
| Volume (vol) | vol.109 |
| Number (no) | 95 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |