Communication-Electromagnetic Compatibility(Date:2010/07/08)

Presentation
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[Date]2010/7/8
[Paper #]
目次

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[Date]2010/7/8
[Paper #]
Evaluation of immunity characteristics for power supply terminals of RF components

Fujiyuki NAKAMOTO,  Takeshi UCHIDA,  Chiharu MIYAZAKI,  Naoto OKA,  Koichiro MISU,  

[Date]2010/7/8
[Paper #]EMCJ2010-21
A Proposal of Near-Field-Measurement Technique in Complex Domain

Toshihiro TAKATSU,  Fengchao XIAO,  Kimitoshi MURANO,  Yoshio KAMI,  

[Date]2010/7/8
[Paper #]EMCJ2010-22
Measurement of Cole-Cole Plot for Wine with an Open Ended Coaxial Probe

Yusuke SATO,  Yusuke KAZAMA,  Yoshinori TAKA,  Osamu FUJIWARA,  

[Date]2010/7/8
[Paper #]EMCJ2010-23
Estimation of Whole-Body Average SARs in Human for Vertical Polarized Far-Field Exposure at Frequencies over 1 GHz Using Spatially Averaged Squares of Induced Currents

Tokio SUZUKI,  Akimasa HIRATA,  Osamu FUJIWARA,  Tomoaki NAGAOKA,  Soichi WATANABE,  

[Date]2010/7/8
[Paper #]EMCJ2010-24
Evaluation Method for EMI of an Implanted Device by Wireless Devices Using Near-field EMF

Satoshi ISHIHARA,  Takahiro IYAMA,  Teruo ONISHI,  Yoshiaki TARUSAWA,  

[Date]2010/7/8
[Paper #]EMCJ2010-25
Estimation of Current Sources Magnitude Using Improved SPM Method

Yuan ZHEN,  Jerdvisanop CHAKAROTHAI,  Qiang CHEN,  Kunio SAWAYA,  

[Date]2010/7/8
[Paper #]EMCJ2010-26
Examination of Reduction Technic for Radiation noise from the power supply layers in PCB : Power supply layer shape

Hitoshi Takakura,  Shinichi Sasaki,  

[Date]2010/7/8
[Paper #]EMCJ2010-27
Effective Position of Decoupling Inductor Taking Parasitic Capacitances on Power Distribution Network Traces into Account

Yusuke YANO,  Kengo IOKIBE,  Yoshitaka TOYOTA,  Ryuji KOGA,  

[Date]2010/7/8
[Paper #]EMCJ2010-28
Selection of position of equivalent current source in LSI linear macro-model using Norton equivalent circuit in transient domain

Teruyoshi YAMASAKI,  Hiroshi TANAKA,  Tohlu MATSUSHIMA,  Takashi HISAKADO,  Osami WADA,  

[Date]2010/7/8
[Paper #]EMCJ2010-29
Relationship between Contact Point Distribution and Common-Mode Current on Connector with Contact Failure

Yu-ichi HAYASHI,  Takaaki MIZUKI,  Hideaki SONE,  

[Date]2010/7/8
[Paper #]EMCJ2010-30
Time Domain Analysis of Single Conductor Line Using Propagating Line Current

Yoshinobu WADA,  Takashi HISAKADO,  Osami WADA,  

[Date]2010/7/8
[Paper #]EMCJ2010-31
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