Presentation 2010-07-15
Relationship between Contact Point Distribution and Common-Mode Current on Connector with Contact Failure
Yu-ichi HAYASHI, Takaaki MIZUKI, Hideaki SONE,
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Abstract(in English) When contact resistance value is low, the change of contact distribution and the number of contact points causes degradation of immunity on a transmission line with connector contact failure. In this paper, we discussed the mechanism that common mode current changes when contact distribution and the number of contact points change. The simulation results, validated by measurement, reveal that both the asymmetric contact distribution and fewer contact points increase the inductance on the connector. Using this lumped element circuit, different cable contact scenarios at the connection, i.e. the contact distribution and the number of contact points, can be simply simulated by changing the inductance term in the model.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Coaxial Connector / Contact Failure / CATV Internet
Paper # EMCJ2010-30
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Conference Information
Committee EMCJ
Conference Date 2010/7/8(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Relationship between Contact Point Distribution and Common-Mode Current on Connector with Contact Failure
Sub Title (in English)
Keyword(1) Coaxial Connector
Keyword(2) Contact Failure
Keyword(3) CATV Internet
1st Author's Name Yu-ichi HAYASHI
1st Author's Affiliation Department of Electrical and Communication Engineering, Graduate School of Engineering, Tohoku University()
2nd Author's Name Takaaki MIZUKI
2nd Author's Affiliation Cyberscience Center, Tohoku University
3rd Author's Name Hideaki SONE
3rd Author's Affiliation Cyberscience Center, Tohoku University
Date 2010-07-15
Paper # EMCJ2010-30
Volume (vol) vol.110
Number (no) 125
Page pp.pp.-
#Pages 4
Date of Issue