Summary

International Technical Conference on Circuits/Systems, Computers and Communications

2008

Session Number:P1

Session:

Number:P1-29

Test Case Generation of Concurrent Programs Based On Event Graph

Zuohua Ding,  Kao Zhang,  Jueliang Hu,  

pp.-

Publication Date:2008/7/7

Online ISSN:2188-5079

DOI:10.34385/proc.39.P1-29

PDF download (92.2KB)

Summary:
This paper attempts to generate test cases for concurrent programs based on event graph. Through the analysis of state transition of event graph, sub-event-graphs can be generated. Each sub-event-graph corresponds to a test case. We may get benefits from this method in the following. 1) While executing the test case, we can monitor the state transition. 2) Every sub-event-graph is an execution path, or a simulation, thus all test cases are feasible. 3) Since the number of states in the event graph is finite, it is not likely to hit state explosion problem in the test generation process.