Summary

International Symposium on Antennas and Propagation

2009

Session Number:1E2

Session:

Number:1E2-6

Study and Analysis of interconnects based on S parameter models

Sungju Choi,  Liu Yang,  Jaeseok Lee,  Hyeongdong Kim,  

pp.233-236

Publication Date:2009/10/21

Online ISSN:2188-5079

DOI:10.34385/proc.51.1E2-6

PDF download (313.7KB)

Summary:
This paper presents study and analysis of interconnects based on scattering parameter (s-parameter) models extracted by full-wave electromagnetic simulation in a CMOS process. This analysis provides well-understanding how back-end layout process affects circuit performance. The analysis of effect of interconnects is investigated in a cascode low-noise circuits for 1.84GHz to 2.5GHz. The metal line between capacitor Cex and inductor LS or the other line shows the result of effect on the full-wave simulation. This analysis will be helpful to have insight of electromagnetic coupling for more complex interconnects.