Summary
International Technical Conference on Circuits/Systems, Computers and Communications
2008
Session Number:E1
Session:
Number:E1-1
Open Lead Detection Based on Logical Change Caused by AC Voltage Signal Stimulus
Akira Ono, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Masao Takagi, Masaki Hashizume,
pp.-
Publication Date:2008/7/7
Online ISSN:2188-5079
Summary:
In this paper, we propose a new test method for detecting an open lead which occurs when an IC is mounted on a printed circuit board. In the method, an open lead is detected by observing output logical change of an open lead detector. Since the test method is a vectorless test one, test generation and test input application are not needed. Testability of the test method is examined by some experiments. The results show that open leads of SSIs and LSIs will be detected by the method.