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2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic Compatibility, Sapporo
| number | title/author |
|---|---|
| ThuPM2C.5 | Microcontroller Sensitivity to Fault-Injection Induced by Near-Field Electromagnetic Interference, Claudepierre, Ludovic Ludovic Claudepierre, Philippe Besnier, |