Summary
International Technical Conference on Circuits/Systems, Computers and Communications
2008
Session Number:P1
Session:
Number:P1-47
Test Framework for Reducing Power in NoC
Seok-hee Yi, Byung-Gyu Ahn, Jong-Wha Chong,
pp.-
Publication Date:2008/7/7
Online ISSN:2188-5079
Summary:
In this paper, we propose the test framework for reducing power in Network-on-Chip (NoC). First, the possibility of using embedded processor and on-chip network are introduced and evaluated with benchmark system to test the other embedded cores. Second, a new generation method of test pattern, which is called "don't care mapping", is presented to reduce the power consumption of on-chip network. The experimental results show that the power consumption is reduced up to 8% at the communication components.