Summary
2016 International Symposium on Antennas and Propagation
2016
Session Number:POS2
Session:
Number:POS2-113
Reduction of Edge Diffraction Effect of MUT Holder Using EM Absorber in W-band Free-space Material Measurements
Jin-Seob Kang, Jeong-Hwan Kim, Jeong-Il Park,
pp.936-937
Publication Date:2016/10/24
Online ISSN:2188-5079
Summary:
In free-space material measurements, it is known that the transverse dimension of a planar MUT (Material Under Test) should be larger than three times the beam waist of the antenna to neglect diffraction effect at the edges of the MUT. To hold the MUT, MU