Summary
International Symposium on Electromagnetic Compatibility
2014
Session Number:15A2-B
Session:
Number:15A2-B3
High Spatial Resolution On-chip Active Magnetic Field Probe for IC Chip-Level Near Field Measurments
Yojiro Shigeta, Noriyuki Sato, Kaoru Arai, Masahiro Yamaguchi, Shingo Kageyama,
pp.-
Publication Date:2014/05/12
Online ISSN:2188-5079
Summary:
An on chip active magnetic field probe has been developed for IC chip-level magnetic near field measurements. A low noise amplifier (LNA) and a loop coil were implemented in 0.18 μm Si-CMOS technology, and solder-bonded to PCB to complete the probe. Its gain is 13.3 dB at 2 GHz. The probe is applied for magnetic near field evaluation of a test element group (TEG) chip that emulates Long Term Evolution (LTE) class radio frequency integrated circuit (RFIC) receiver and . It is demonstrated to detect on-chip in-band interference sources.