Summary
International Symposium on Electromagnetic Compatibility
2009
Session Number:24P1
Session:
Number:24P1-3
Metamaterial Wave Absorber to Improve Oblique Incident Characteristics
T. Aoyagi, K. Murano, A. Nishikata, Y. Kotsuka,
pp.733-736
Publication Date:2009/7/20
Online ISSN:2188-5079
Summary:
We propose novel RH-metamaterial structure of the Z-chip for improving the oblique incidence characteristics as an electromagnetic wave absorber. The basic characteristics of a wave absorber using a Z-chip is calculated by FDTD simulation at an oblique incidence. To demonstrate the efficiencies of the chip, a unit cell like a Z-chip was introduced to an actual computer controlled metamaterial electromagnetic wave absorber. The free space method is applied to measure the oblique incident reflection coefficient of the absorber. As a result, it is shown that the TM oblique incidence characteristics were improved the by structural improvement of the chip. Key words: wave absorber, metamaterial, reflection coefficient, electromagnetic compatibility, oblique incidence.